dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Kaniava, A. | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-09-29T12:55:50Z | |
dc.date.available | 2021-09-29T12:55:50Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/500 | |
dc.source | IIOimport | |
dc.title | The impact of processing-induced defects on the electrical characteristics and the degradation of Si n+p junctions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 72 | |
dc.source.endpage | 81 | |
dc.source.conference | Proc. Symp. on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects | |
dc.source.conferencedate | 1/10/1993 | |
dc.source.conferencelocation | New Orleans, LA USA | |
imec.availability | Published - imec | |
imec.internalnotes | ECS Proceedings | |