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White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

dc.contributor.authorChen, W. M.
dc.contributor.authorMcNally, P. J.
dc.contributor.authorJacobs, Koen
dc.contributor.authorTuomi, T.
dc.contributor.authorDanilewsky, A. N.
dc.contributor.authorLowney, D.
dc.contributor.authorKanatharana, J.
dc.contributor.authorKnuuttila, L.
dc.contributor.authorRiikonen, J.
dc.date.accessioned2021-10-14T16:41:26Z
dc.date.available2021-10-14T16:41:26Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5137
dc.sourceIIOimport
dc.titleWhite beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceMRS Fall Meeting 2001: Symposium I: GaN and related alloys; November 26-30, 2001; Boston, MA, USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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