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TOFSIMS as a monitor for thin film growth
Publication:
TOFSIMS as a monitor for thin film growth
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Vandervorst, Wilfried
;
Pétry, Jasmine
;
Zhao, Chao
;
Besling, Wim
;
Nohira, Hiroshi
;
Richard, Olivier
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2000
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Acq. date: 2026-02-24
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Statistics
Views
2000
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2026-02-24
Citations