dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Van Esch, Ann | |
dc.contributor.author | Van Roy, Wim | |
dc.contributor.author | Oesterholt, René | |
dc.contributor.author | De Boeck, Jo | |
dc.contributor.author | Borghs, Gustaaf | |
dc.date.accessioned | 2021-09-29T13:04:14Z | |
dc.date.available | 2021-09-29T13:04:14Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/519 | |
dc.source | IIOimport | |
dc.title | Structural characterization of In1-xMnxAs and Ga1-xMnxAs epitaxial magnetic films grown by MBE on GaAs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Van Roy, Wim | |
dc.contributor.imecauthor | De Boeck, Jo | |
dc.contributor.imecauthor | Borghs, Gustaaf | |
dc.contributor.orcidimec | Van Roy, Wim::0000-0003-3232-1987 | |
dc.contributor.orcidimec | De Boeck, Jo::0000-0001-8244-1552 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 293 | |
dc.source.endpage | 296 | |
dc.source.conference | Microscopy of Semiconducting Materials 1995. Proceedings | |
dc.source.conferencedate | 20/03/1985 | |
dc.source.conferencelocation | Oxford UK | |
imec.availability | Published - open access | |
imec.internalnotes | IOP Conference Series; Vol. 146 | |