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dc.contributor.authorBender, Hugo
dc.contributor.authorVan Esch, Ann
dc.contributor.authorVan Roy, Wim
dc.contributor.authorOesterholt, René
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-09-29T13:04:14Z
dc.date.available2021-09-29T13:04:14Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/519
dc.sourceIIOimport
dc.titleStructural characterization of In1-xMnxAs and Ga1-xMnxAs epitaxial magnetic films grown by MBE on GaAs
dc.typeProceedings paper
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVan Roy, Wim
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecVan Roy, Wim::0000-0003-3232-1987
dc.contributor.orcidimecDe Boeck, Jo::0000-0001-8244-1552
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage293
dc.source.endpage296
dc.source.conferenceMicroscopy of Semiconducting Materials 1995. Proceedings
dc.source.conferencedate20/03/1985
dc.source.conferencelocationOxford UK
imec.availabilityPublished - open access
imec.internalnotesIOP Conference Series; Vol. 146


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