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Raman spectroscopy: a unique tool for the study of thin films

dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-14T16:48:20Z
dc.date.available2021-10-14T16:48:20Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5221
dc.sourceIIOimport
dc.titleRaman spectroscopy: a unique tool for the study of thin films
dc.typeProceedings paper
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.beginpageG81.1.1
dc.source.endpageG8.1.12
dc.source.conferencePolycrystalline Metal and Magnetic Thin Films - 2000
dc.source.conferencedate24/04/2001
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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