Authors

Hefyene, N.; Anghel, C.; Ionescu, A. M.; Frere, S.; Gillon, R.; Vermandel, Miguel; Bakeroot, Benoit; Doutrloigne, J.

Conference

Proceedings of the 31st European Solid-State Device Research Conference

Title

An experimental approach for bias-dependent drain series resistance evaluation in asymmetric HV MOSFETs

Publication type

Proceedings paper