An experimental approach for bias-dependent drain series resistance evaluation in asymmetric HV MOSFETs

Publication:

2001

Proceedings Paper

Author(s)

Hefyene, N.

;

Anghel, C.

;

Ionescu, A. M.

;

Frere, S.

;

Gillon, R.

;

Vermandel, Miguel

;

;

Doutrloigne, J.

1978 since deposited on 2021-10-14

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Acq. date: 2026-10-05