Authors

Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K.

Issue

9_10

Journal

Microelectronics Reliability

Volume

41

Title

Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation

Publication type

Journal article