dc.contributor.author | Onsia, Bart | |
dc.contributor.author | Schellkes, E. | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Doll, O. | |
dc.contributor.author | Fester, A. | |
dc.contributor.author | Kolbesen, B. O. | |
dc.contributor.author | Hoffman, M. | |
dc.contributor.author | Hatcher, Z. | |
dc.contributor.author | Wolke, K. | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-14T17:32:19Z | |
dc.date.available | 2021-10-14T17:32:19Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5553 | |
dc.source | IIOimport | |
dc.title | Advanced single chemistry alkaline cleaning in a STEAG single tank tool | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Onsia, Bart | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.source.peerreview | no | |
dc.source.conference | 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac | |
dc.source.conferencedate | 2/09/2001 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - imec | |