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dc.contributor.authorOnsia, Bart
dc.contributor.authorSchellkes, E.
dc.contributor.authorVos, Rita
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorDoll, O.
dc.contributor.authorFester, A.
dc.contributor.authorKolbesen, B. O.
dc.contributor.authorHoffman, M.
dc.contributor.authorHatcher, Z.
dc.contributor.authorWolke, K.
dc.contributor.authorMertens, Paul
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-14T17:32:19Z
dc.date.available2021-10-14T17:32:19Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5553
dc.sourceIIOimport
dc.titleAdvanced single chemistry alkaline cleaning in a STEAG single tank tool
dc.typeMeeting abstract
dc.contributor.imecauthorOnsia, Bart
dc.contributor.imecauthorVos, Rita
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewno
dc.source.conference200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac
dc.source.conferencedate2/09/2001
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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