Thermal management in a new ultra-thin chip stack technology

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Authors
Pinel, S.; Tasselli, J.; Bailbe, J. P.; Marty, A.; Marco, S.; Morante, J. R.; Beyne, Eric; Van Hoof, Rita; Vendier, O.; Huan, M.
Conference
Proceedings of the 2nd Eurosime Conference; 9-11 April 2001; Paris, France.
Title
Thermal management in a new ultra-thin chip stack technology
Publication type
Proceedings paper
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