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Low-frequency noise diagnostics of radiation effects in silicon devices

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-09-29T13:04:34Z
dc.date.available2021-09-29T13:04:34Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/558
dc.sourceIIOimport
dc.titleLow-frequency noise diagnostics of radiation effects in silicon devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage579
dc.source.endpage584
dc.source.conferenceNoise in Physical Systems and 1/f Fluctuations - ICNF. Proceedings of the 13th International Conference
dc.source.conferencedate29/05/1995
dc.source.conferencelocationPalanga Lithuania
imec.availabilityPublished - open access


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