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dc.contributor.authorProost, Joris
dc.contributor.authorMaex, Karen
dc.contributor.authorDelaey, L.
dc.date.accessioned2021-10-14T17:38:53Z
dc.date.available2021-10-14T17:38:53Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5593
dc.sourceIIOimport
dc.titlePlasticity of electromigration-induced hillocking and how it affects the critical length
dc.typeOral presentation
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewno
dc.source.conferenceSymposium P of the MRS Spring Meeting: Dislocations and Deformation Mechanisms in Thin Films and Small Structures; 17-19 April 2
dc.source.conferencelocation
imec.availabilityPublished - imec


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