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Noise performance of Si devices for space applications

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-09-29T13:04:34Z
dc.date.available2021-09-29T13:04:34Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/559
dc.sourceIIOimport
dc.titleNoise performance of Si devices for space applications
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage74
dc.source.endpage81
dc.source.conferenceNoise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop
dc.source.conferencedate18/07/1995
dc.source.conferencelocationBrno Czech Republic
imec.availabilityPublished - open access


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