dc.contributor.author | Clarysse, Trudo | |
dc.contributor.author | De Wolf, Peter | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-09-29T13:04:36Z | |
dc.date.available | 2021-09-29T13:04:36Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/561 | |
dc.source | IIOimport | |
dc.title | Recent insights in the physical modeling of the spreading resistance point contact | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 29.1 | |
dc.source.endpage | 29.2 | |
dc.source.conference | 3rd Int. Workshop on the Measurement and Characterizaton of Ultra-Shallow Dopant Profiles in Semiconductors | |
dc.source.conferencedate | 20/03/1995 | |
dc.source.conferencelocation | Research Triangle Park, NC USA | |
imec.availability | Published - open access | |