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Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultra thin oxides
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Authors
Roussel, Philippe
;
Degraeve, Robin
;
Van den bosch, G.
;
Kaczer, Ben
;
Groeseneken, Guido
Conference
39th Annual International Reliability Physics Symposium; 30 April - 3 May 2001; Orlando, FL, USA.
Title
Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultra thin oxides
Publication type
Proceedings paper
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