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Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics

dc.contributor.authorRoussel, Philippe
dc.contributor.authorDegraeve, Robin
dc.contributor.authorVan den bosch, G.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-14T17:44:25Z
dc.date.available2021-10-14T17:44:25Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5625
dc.sourceIIOimport
dc.titleAccurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
dc.typeJournal article
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.beginpage120
dc.source.endpage127
dc.source.journalIEEE Trans. Device and Materials Reliability
dc.source.issue2
dc.source.volume1
imec.availabilityPublished - imec


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