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Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
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Authors
Roussel, Philippe
;
Degraeve, Robin
;
Van den bosch, G.
;
Kaczer, Ben
;
Groeseneken, Guido
Issue
2
Journal
IEEE Trans. Device and Materials Reliability
Volume
1
Title
Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
Publication type
Journal article
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