Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics

dc.contributor.author	Roussel, Philippe
dc.contributor.author	Degraeve, Robin
dc.contributor.author	Van den bosch, G.
dc.contributor.author	Kaczer, Ben
dc.contributor.author	Groeseneken, Guido
dc.contributor.imecauthor	Roussel, Philippe
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Roussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.date.accessioned	2021-10-14T17:44:25Z
dc.date.available	2021-10-14T17:44:25Z
dc.date.issued	2001
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/5625
dc.source.beginpage	120
dc.source.endpage	127
dc.source.issue	2
dc.source.journal	IEEE Trans. Device and Materials Reliability
dc.source.volume	1
dc.title	Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
dc.type	Journal article
dspace.entity.type	Publication
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