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Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier MMIC

dc.contributor.authorSchreurs, Dominique
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorVandersmissen, Raf
dc.contributor.authorNeuhaus, B.
dc.contributor.authorBeyer, A.
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-10-14T17:46:33Z
dc.date.available2021-10-14T17:46:33Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5637
dc.sourceIIOimport
dc.titleCorrelation between the reliability of HEMT devices and that of a combined oscillator-amplifier MMIC
dc.typeProceedings paper
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.source.peerreviewno
dc.source.conferenceGAAS - European Gallium Arsenide and other Semiconductors Application Symposium
dc.source.conferencedate24/09/2001
dc.source.conferencelocationLondon UK
imec.availabilityPublished - imec


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