Show simple item record

Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure

dc.contributor.authorSchuler, Franz
dc.contributor.authorTempel, Georg
dc.contributor.authorMelzner, H.
dc.contributor.authorHendrickx, Paul
dc.contributor.authorWellekens, Dirk
dc.contributor.authorLorenzini, Martino
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-14T17:46:55Z
dc.date.available2021-10-14T17:46:55Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5639
dc.sourceIIOimport
dc.titleTime dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure
dc.typeProceedings paper
dc.contributor.imecauthorHendrickx, Paul
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage536
dc.source.endpage537
dc.source.conferenceExtended Abstracts of the 2001 International Conference on Solid State Devices and Materials - SSDM
dc.source.conferencelocationTokyo Japan
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record