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Random telegraph signals : a local probe for single point defect studies in solid-state devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T17:50:12Z
dc.date.available2021-10-14T17:50:12Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5658
dc.sourceIIOimport
dc.titleRandom telegraph signals : a local probe for single point defect studies in solid-state devices
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceDRIP IX : 9th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors
dc.source.conferencedate24/09/2001
dc.source.conferencelocationRimini Italy
imec.availabilityPublished - imec
imec.internalnotesTo be publ in 2002 in Materials Science and Engineering B


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