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Photoluminescence and deep-level transient spectroscopy study of tin related radiation defects in silicon

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorPrivitera, Vittorio
dc.contributor.authorCoffa, S.
dc.contributor.authorNylandsted Larsen, A.
dc.contributor.authorClauws, P.
dc.date.accessioned2021-10-14T17:50:55Z
dc.date.available2021-10-14T17:50:55Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5662
dc.sourceIIOimport
dc.titlePhotoluminescence and deep-level transient spectroscopy study of tin related radiation defects in silicon
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpageCM45
dc.source.conferenceGeneral Scientific Meeting Belgian Physical Society
dc.source.conferencedate16/05/2001
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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