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Flicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide

dc.contributor.authorSimoen, Eddy
dc.contributor.authorDa Rold, Martina
dc.contributor.authorClaeys, Cor
dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.date.accessioned2021-10-14T17:51:06Z
dc.date.available2021-10-14T17:51:06Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5663
dc.sourceIIOimport
dc.titleFlicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage177
dc.source.endpage180
dc.source.conferenceProceedings of the 16th International Conference on Noise in Physical Systems and 1/f Fluctuations - ICNF
dc.source.conferencedate22/10/2001
dc.source.conferencelocationGainesville, FL USA
imec.availabilityPublished - imec


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