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Dimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials
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Dimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials
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Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stevens, Nobby
;
Martens, Luc
Journal
Abstract
Description
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1875
since deposited on 2021-10-14
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Acq. date: 2025-12-14
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Metrics
Views
1875
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-14
Citations