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CMOS device optimisation for mixed-signal technologies

dc.contributor.authorStolk, Peter
dc.contributor.authorTuinhout, Hans
dc.contributor.authorDuffy, Ray
dc.contributor.authorAugendre, Emmanuel
dc.contributor.authorBellefroid, L. P.
dc.contributor.authorBolt, M. J. B.
dc.contributor.authorCroon, Jeroen
dc.contributor.authorDachs, Charles
dc.contributor.authorHuisman, F. R. J.
dc.contributor.authorMoonen, A. J.
dc.contributor.authorPonomarev, Youri
dc.contributor.authorRoes, R. F. M.
dc.contributor.authorDa Rold, Martina
dc.contributor.authorSeevinck, E.
dc.contributor.authorSreerambhatla, K. N.
dc.contributor.authorSurdeanu, Radu
dc.contributor.authorVelghe, Rudolf
dc.contributor.authorVertregt, M.
dc.contributor.authorWebster, M. N.
dc.contributor.authorvan Winkelhoff, N. K. J.
dc.contributor.authorZegers-Van Duijnhoven, A. T. A.
dc.date.accessioned2021-10-14T17:54:24Z
dc.date.available2021-10-14T17:54:24Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5681
dc.sourceIIOimport
dc.titleCMOS device optimisation for mixed-signal technologies
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage215
dc.source.endpage218
dc.source.conferenceIEDM Technical Digest
dc.source.conferencedate2/12/2001
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - imec


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