Authors

Vassilev, Vesselin; Lorenzini, Martino; Groeseneken, Guido; Steyaert, Michel; Maes, Herman

Conference

Electrical Overstress/Electrostratic Discharge Syymposium Proceedings - EOS/ESD

Title

Analysis and improved compact modelling of the breakdown behaviour of sub-0.25 micron ESD protection ggNMOS devices

Publication type

Proceedings paper