Publication:

Analysis and improved compact modelling of the breakdown behaviour of sub-0.25 micron ESD protection ggNMOS devices

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1928 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-09

Citations

Metrics

Views

1928 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-09

Citations