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Reliable 2-d carrier profiling with SSRM on InP-based devices

dc.contributor.authorXu, Mingwei
dc.contributor.authorHantschel, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-14T18:27:07Z
dc.date.available2021-10-14T18:27:07Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5850
dc.sourceIIOimport
dc.titleReliable 2-d carrier profiling with SSRM on InP-based devices
dc.typeProceedings paper
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.beginpage541
dc.source.endpage544
dc.source.conferenceProceedings International Conference on Indium Phosphide and Related Materials; 14-18 May 2001; Nara, Japan.
dc.source.conferencedate14/05/2001
dc.source.conferencelocationNara Japan
imec.availabilityPublished - imec


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