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CAD-oriented analytic formulas for self and mutual capacitance of interconnects on an Si-SiO2 substrate

dc.contributor.authorYmeri, Hasan
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMaex, Karen
dc.contributor.authorVandenberghe, S.
dc.contributor.authorDe Roest, David
dc.contributor.authorStucchi, Michele
dc.date.accessioned2021-10-14T18:29:46Z
dc.date.available2021-10-14T18:29:46Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5863
dc.sourceIIOimport
dc.titleCAD-oriented analytic formulas for self and mutual capacitance of interconnects on an Si-SiO2 substrate
dc.typeProceedings paper
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorDe Roest, David
dc.contributor.imecauthorStucchi, Michele
dc.source.peerreviewno
dc.source.conferenceProceedings GAAS - European Gallium Arsenide and other Semiconductors Application Symposium
dc.source.conferencedate24/09/2001
dc.source.conferencelocationLondon UK
imec.availabilityPublished - imec


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