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Conductance creep and breakdown of stressed ferromagnetic tunneljunctions

dc.contributor.authorDas, Jo
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorLagae, Liesbet
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-14T18:41:12Z
dc.date.available2021-10-14T18:41:12Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5918
dc.sourceIIOimport
dc.titleConductance creep and breakdown of stressed ferromagnetic tunneljunctions
dc.typeMeeting abstract
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorBorghs, Gustaaf
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage386
dc.source.conferenceAbstracts 8th Joint MMM-Intermag Conference
dc.source.conferencedate7/01/2001
dc.source.conferencelocationSan Antonio, TX USA
imec.availabilityPublished - open access


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