dc.contributor.author | Holsteyns, Frank | |
dc.contributor.author | Fyen, Wim | |
dc.contributor.author | Lauerhaas, Jeff | |
dc.contributor.author | Arnauts, Sophia | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-14T18:41:38Z | |
dc.date.available | 2021-10-14T18:41:38Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5920 | |
dc.source | IIOimport | |
dc.title | Single wafer drying | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.imecauthor | Arnauts, Sophia | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | Wafer Cleaning and Surface Preparation Workshop | |
dc.source.conferencedate | 15/05/2001 | |
dc.source.conferencelocation | Austin, TX USA | |
imec.availability | Published - open access | |
imec.internalnotes | International Sematech | |