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The use of random effects in modeling non-linear hot-carrier degradation data

dc.contributor.authorAndries, E.
dc.contributor.authorCroes, K.
dc.contributor.authorDreesen, R.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorDe Schepper, Luc
dc.date.accessioned2021-10-14T21:07:14Z
dc.date.available2021-10-14T21:07:14Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5956
dc.sourceIIOimport
dc.titleThe use of random effects in modeling non-linear hot-carrier degradation data
dc.typeProceedings paper
dc.contributor.imecauthorDe Ceuninck, Ward
dc.source.peerreviewno
dc.source.beginpage35
dc.source.endpage38
dc.source.conferenceCommunications of the 3rd International Conference on Mathematical Methods in Reliability - MMR
dc.source.conferencedate17/06/2002
dc.source.conferencelocationTrondheim Norway
imec.availabilityPublished - imec


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