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Modeling and experimental verification of substrate noise generation in a 220Kgates WLAN system-on-chip with multiple supplies

dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorDonnay, Stephane
dc.contributor.authorDe Man, Hugo
dc.contributor.authorZinzius, Y.
dc.contributor.authorGielen, Georges
dc.contributor.authorFonden, T.
dc.date.accessioned2021-10-14T21:07:37Z
dc.date.available2021-10-14T21:07:37Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5975
dc.sourceIIOimport
dc.titleModeling and experimental verification of substrate noise generation in a 220Kgates WLAN system-on-chip with multiple supplies
dc.typeProceedings paper
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage291
dc.source.endpage294
dc.source.conferenceProceedings European Solid-State Circuit Conference - ESSCIRC
dc.source.conferencedate23/09/2002
dc.source.conferencelocationFirenze Belgium
imec.availabilityPublished - imec


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