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Inhomogeneous Charge Carrier Density in Wafer-Scale MoS<sub>2</sub> Caused by Locally Varying Substrate Doping
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Inhomogeneous Charge Carrier Density in Wafer-Scale MoS<sub>2</sub> Caused by Locally Varying Substrate Doping
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Date
2026
Journal article
https://doi.org/10.1021/acsami.6c00562
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Myja, Henrik
;
Abdelbaky, Mohamed
;
Ustenko, Sofiia
;
Kumar, Pawan
;
Groven, Benjamin
;
Medina Silva, Henry
;
Morin, Pierre
;
Mertin, Wolfgang
;
Kümmell, Tilmar
;
Bacher, Gerd
Journal
ACS APPLIED MATERIALS & INTERFACES
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8
since deposited on 2026-07-24
Acq. date: 2026-08-20
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Views
8
since deposited on 2026-07-24
Acq. date: 2026-08-20
Citations