Browsing Presentations by imec author "0e60cb089d219c0828aa30209054a06c04a5d70c"
Now showing items 1-3 of 3
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Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Reliability aware design: from single defect physics to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter; Grasser, Tibor; Roussel, Philippe; Groeseneken, Guido (2012) -
Workload-dependent BTI reliability evaluation of CMOS logic gates
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2012)