Browsing Presentations by author "Nafria, Montserrat"
Now showing items 1-3 of 3
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Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Influence of vacuum environment in conductive AFM measurements on advanced MOS gate dielectrics
Aguilera, Lidia; Polspoel, Wouter; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2007) -
Stochastic piecewise modeling of post-BD gate current oriented to circuit design
Martin-Martinez, Javier; Kaczer, Ben; Ayala, N; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, X; Zuber, Paul; Dierickx, Bart (2008)