Browsing Presentations by author "Jacobs, Koen"
Now showing items 1-15 of 15
-
Cathodoluminescence from InGaN/GaN MQW grown on an epitaxially lateral overgrown GaN epilayer
Trager-Cowan, C.; Mohammed, A.; Manson-Smith, S. K.; O'Donnell, K. P.; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet (1999) -
Chemical mapping of V-defects in InGaN MQWs
Sharma, N.; Tricker, D. M.; Thomas, P. J.; Humphreys, C. J.; Bougrioua, Zahia; Jacobs, Koen; Cheyns, Jan; Moerman, Ingrid; Thrush, T.; Considine, L.; Boyd, A. (2000) -
Chemical role of SF6 in a SiCl4-based reactive ion etching of GaN
Karouta, F.; Jacobs, B.; Kramer, M. C. J. C. M.; Jacobs, Koen; Moerman, Ingrid (1999) -
Development of GaN-materials for optoelectronic applications
Cheyns, Jan; Jacobs, Koen; Bougrioua, Zahia; Moerman, Ingrid (2000) -
Elastic strain in InGaN and AlGaN layers
Wu, Ming Fang; Yao, S.; Vantomme, Andre; Hogg, S.; Langouche, G.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Li, J.; Zhang, G. Y. (1999) -
Ideal chemistry for reactive ion etching of GaN
Karouta, F.; Jacobs, B.; Jacobs, Koen; Moerman, Ingrid (1999) -
Ideal chemistry for reactive ion etching of GaN
Karouta, F.; Jacobs, B.; Jacobs, Koen; Moerman, Ingrid (1999) -
Laser reflectance monitoring of GaN MOCVD growth
Stafford, A.; Irvine, S. J. C.; Bougrioua, Zahia; Jacobs, Koen; Moerman, Ingrid; Thrush, E.; Considine, L.; Crawley, J. (1999) -
Optical spectroscopy and composition of InGaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen; Martin, R. W. (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Middleton, P. G.; Mohammed, A.; Manson-Smith, S. K.; Osborne, I.; Barisonzi, M.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet (1999) -
Some considerations on the growth of highly resistive GaN layers
Bougrioua, Zahia; Jacobs, Koen; Cheyns, Jan; Moerman, Ingrid; Thruch, E. J.; Wallis, R. H.; Davies, R. A. (2000) -
The dependence of the optical energies on InGaN composition
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Esona, K.; Trager-Cowan, C.; Jacobs, Koen; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet; Merlet, C.; Gil, B.; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. W. (2000) -
White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN
Chen, W. M.; McNally, P. J.; Jacobs, Koen; Tuomi, T.; Danilewsky, A. N.; Lowney, D.; Kanatharana, J.; Knuuttila, L.; Riikonen, J. (2001)