Browsing Presentations by imec author "793ba003b0943e41fd3e91c58986cfbb28f174fa"
Now showing items 1-2 of 2
-
Combining UHV AFM and SEM for high resolution, repeatable and low noise scanning spreading resistance microscopy
Eyben, Pierre; Chintala, Ravi Chandra; Mannarino, Manuel; Nazir, Aftab; Schulze, Andreas; Vandervorst, Wilfried (2013) -
Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM
Celano, Umberto; Chintala, Ravi Chandra; Hoflijk, Ilse; Moussa, Alain; Vanhaeren, Danielle; Mannarino, Manuel; Nazir, Aftab; Eyben, Pierre; Vandervorst, Wilfried (2013)