Browsing Presentations by imec author "8d6aa9e54d278a6ab39ef36aa47a34c8250a2600"
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ESD reliability issues in sub-micron CMOS - trends and challenges
Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; De Heyn, Vincent; Daenen, Tom; Groeseneken, Guido (2003) -
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Marinissen, Erik Jan; Daenen, Tom; Dupas, Luc; Van Dievel, Marc; Hanaway, Peter; Kiesewetter, Joerg; Smith, Ken; Strid, Eric; Thaerigen, Thomas (2011)