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Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Publication:
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Date
2011
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Daenen, Tom
;
Dupas, Luc
;
Van Dievel, Marc
;
Hanaway, Peter
;
Kiesewetter, Joerg
;
Smith, Ken
;
Strid, Eric
;
Thaerigen, Thomas
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1945
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations
Metrics
Views
1945
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations