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    • Impact of thinning and packaging on a deep sub-micron CMOS product 

      Perry, Dan; Ray, Urmi; Gu, Sam; Nakamoto, Mark; Sy, Wing; Wang, Kevin; Ruythooren, Wouter; Yang, Yu; De Wolf, Ingrid; Cotrin Teixeira, Ricardo; Gonzalez, Mario; Simons, Veerle; Berry, Christopher J.; Lee, KiWook; Burggraf, Jürgen; Pargfrieder, Stefan (2009)