Browsing Presentations by imec author "bd846ae7260b521afaafc372ac616d9737006286"
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Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001) -
Scanning spreading resistance microscopy for the calibration of process simulators on 65nm MOS technology.
Vemula, Sri Charan; Eyben, Pierre; De Keersgieter, An; Mody, Jay; Vandervorst, Wilfried (2007) -
Transistor optimisation for a low-cost, high-performance 0.13 μm CMOS technology
Augendre, Emmanuel; Kubicek, Stefan; De Keersgieter, An; Mertens, S.; Lindsay, Richard; Verbeeck, Rita; Van Laer, Joris; Dupas, Luc; Badenes, Gonçal (2001)