Publication:

Impact of oxide breakdown on FET and circuit operation and reliability

Date

2001
Presentation
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Kaczer, Ben  
;
Degraeve, Robin  
;
De Keersgieter, An  
;
Van de Mieroop, Koen
;
Rasras, Mahmoud
;
Simons, Veerle  
;
Roussel, Philippe  
;
Groeseneken, Guido  

Journal

Abstract

Description

Statistics

Views

2013 since deposited on 2021-10-14
2last month
Acq. date: 2026-01-14

Citations

Statistics

Views

2013 since deposited on 2021-10-14
2last month
Acq. date: 2026-01-14

Citations