Publication:

Impact of oxide breakdown on FET and circuit operation and reliability

Date

2001
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Author(s)

Kaczer, Ben  
;
Degraeve, Robin  
;
De Keersgieter, An  
;
Van de Mieroop, Koen
;
Rasras, Mahmoud
;
Simons, Veerle  
;
Roussel, Philippe  
;
Groeseneken, Guido  

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2018 since deposited on 2021-10-14
Acq. date: 2026-07-17

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2018 since deposited on 2021-10-14
Acq. date: 2026-07-17

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