Publication:

Impact of oxide breakdown on FET and circuit operation and reliability

Date

2001

Presentation

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Author(s)

;

Degraeve, Robin

;

De Keersgieter, An

;

Van de Mieroop, Koen

;

Rasras, Mahmoud

;

;

Roussel, Philippe

;

Groeseneken, Guido

Statistics

2016 since deposited on 2021-10-14

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Acq. date: 2026-04-05