Publication:

Impact of oxide breakdown on FET and circuit operation and reliability

Date

2001

Presentation

Simple item page Full metadata Statistics

Author(s)

;

Degraeve, Robin

;

De Keersgieter, An

;

Van de Mieroop, Koen

;

Rasras, Mahmoud

;

;

Roussel, Philippe

;

Groeseneken, Guido

Metrics

2011 since deposited on 2021-10-14

Acq. date: 2025-12-15