Browsing Presentations by imec author "c30f16620323628cf391d29809be5c5894e1ab9e"
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Defectivity evaluation of EUV reticles with etched multilayer image border by wafer printing analysis
Watanabe, Genta; Jonckheere, Rik; Verduijn, Erik; Fukugami, Norihito; Sakata, Yo; Kodera, Yutaka; Gallagher, Emily (2015) -
EUV scanner printability evaluation of natural blank defects detected by actinic blank inspection
Takagi, Noriaki; Watanabe, Hidehiro; Van Den Heuvel, Dieter; Jonckheere, Rik; Gallagher, Emily (2015) -
Optical testing of EUV pellicle materials
Pollentier, Ivan; Vanpaemel, Johannes; Zahedmanesh, Houman; Adelmann, Christoph; Huyghebaert, Cedric; Gallagher, Emily; Brose, Sasha; Danylyuk, Serhij; Bergmann, Klaus (2015)