Browsing Presentations by author "Rasras, Mahmoud"
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Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001)