Recently added

Analysis of single-case experimental case data using a linear mixed-effects model: A simulation study

Declercq, Lies; Van den Noortgate, Wim (2017)

3D Device/package fault isolation and failure analysis

De Wolf, Ingrid (2017)

The CM300, MHU300 and PDC50 in wafer FAB

De Wachter, Bart (2017)

The low-temeprature chemical synthesis of an LTO based material for Li-ion batteries

De Sloovere, Dries; Marchal, Wouter; Ulu Okudur, Fuyla; Van Bael, Marlies; Hardy, An (2017)

Low-temperature synthesized agglomerated nanoperticles of Li4Ti5O12 for energy storage

De Sloovere, Dries; Fuyla, Ulu; Vranken, Thomas; Verheijen, Maarten; Van Bael, Marlies; Hardy, An (2017)

Test vehicle for electromigration testing of 3D IC

De Messemaeker, Joke; Stucchi, Michele; Croes, Kristof (2017)

Structuring Usage-based Material on Syntactic and Semantic Grounds

De Hertog, Dirk; Desmet, Piet (2017)

Distributional Models in CALL and NLP

De Hertog, Dirk (2017)

Improving exact methods for solving 3D cutting and packing problems

Da Silva, Everton; Toffolo, Tulio; Vanden Berghe, Greet; Wauters, Tony (2017)

Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs

Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Arnoldi, Laurent; Bogdanowicz, Janusz; Fleischmann, Claudia; Vandervorst, Wilfried (2017)

A CMOS 79GHz PMCW radar SoC

Craninckx, Jan (2017)

Using survival analysis to explain dropout in autonomous CALL practice with web-based mini-games

Cornillie, Frederik; Fernandez Castilla, Belén (2017)

Computational nanometrology of line edge roughness: recent challenges and advances

Constantoudis, Vassilios; Papavieros, George; Lorusso, Gian; Gogolides, Evangelos (2017)

Spin-wave propagation in sub-micron sized CoFeB waveguides

Ciubotaru, Florin; Talmelli, Giacomo; Fischer, Tobias; Chumak, Andrii; Pirro, Philipp; Devolder, Thibaut; Hillebrands, Burkard; Adelmann, Christoph; Radu, Iuliana (2017)

Analysis of a constructive matheuristics for the traveling umpire problem

Chirayil Chandrasekharan, R.C.; Toffolo, Tulio; Wauters, Tony (2017)

Characterization of grain boundaries and impact of plasma-induced patterned in 2D materials

Celano, Umberto; Virkki, Olli; Chiappe, Daniele; Heyne, Markus; Hoflijk, Ilse; Franquet, Alexis; Huyghebaert, Cedric; Paredis, Kristof; De Gendt, Stefan; Radu, Iuliana; Vandervorst, Wilfried (2017)

Can we jump over the memory wall with near- or in-memory computing?

Catthoor, Francky (2017)

Proposing amodel to investigate the impact of interconnectiontechnology on shading damage by TFPV modules

Carolus, Jorne; Van De Sande, Wieland; Vandebergh, Thomas; Bakker, Klaas; Meuris, Marc; Daenen, Michaël (2017)

Impact of potential-induced degradation(PID) on PV parameters

Carolus, Jorne; Govaerts, Jonathan; Voroshazi, Eszter; De Ceuninck, Ward; Daenen, Michaël (2017)

Impact of potential-induced degradation (PID) on PV parameters

Carolus, Jorne; Govaerts, Jonathan; Voroshazi, Eszter; De Ceuninck, Ward; Daenen, Michaël (2017)

Presentations: Recent submissions

Analysis of single-case experimental case data using a linear mixed-effects model: A simulation study ﻿

3D Device/package fault isolation and failure analysis ﻿

The CM300, MHU300 and PDC50 in wafer FAB ﻿

The low-temeprature chemical synthesis of an LTO based material for Li-ion batteries ﻿

Low-temperature synthesized agglomerated nanoperticles of Li4Ti5O12 for energy storage ﻿

Test vehicle for electromigration testing of 3D IC ﻿

Structuring Usage-based Material on Syntactic and Semantic Grounds ﻿

Distributional Models in CALL and NLP ﻿

Improving exact methods for solving 3D cutting and packing problems ﻿

Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs ﻿

A CMOS 79GHz PMCW radar SoC ﻿

Using survival analysis to explain dropout in autonomous CALL practice with web-based mini-games ﻿

Computational nanometrology of line edge roughness: recent challenges and advances ﻿

Spin-wave propagation in sub-micron sized CoFeB waveguides ﻿

Analysis of a constructive matheuristics for the traveling umpire problem ﻿

Characterization of grain boundaries and impact of plasma-induced patterned in 2D materials ﻿

Can we jump over the memory wall with near- or in-memory computing? ﻿

Proposing amodel to investigate the impact of interconnectiontechnology on shading damage by TFPV modules ﻿

Impact of potential-induced degradation(PID) on PV parameters ﻿

Impact of potential-induced degradation (PID) on PV parameters ﻿