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Radiation-induced degradation effects in CMOS active pixel sensors and design of a radiation-tolerant image sensor
Publication:
Radiation-induced degradation effects in CMOS active pixel sensors and design of a radiation-tolerant image sensor
Date
2002-04
Dissertation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogaerts, Jan
Journal
Abstract
Description
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2130
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
2130
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations