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Accurate RF electrical characterisation of CSPs using MCM-D thin film technology

dc.contributor.authorChandrasekhar, Arun
dc.contributor.authorBeyne, Eric
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-10-14T21:13:21Z
dc.date.available2021-10-14T21:13:21Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6094
dc.sourceIIOimport
dc.titleAccurate RF electrical characterisation of CSPs using MCM-D thin film technology
dc.typeProceedings paper
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.source.peerreviewno
dc.source.beginpage70
dc.source.endpage78
dc.source.conferenceProceedings 52nd Electronic Components and Technology Conference
dc.source.conferencedate28/05/2002
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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