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Improved on-chip lightwave measurements of non-planar optoelectronic devices

dc.contributor.authorDebie, Peter
dc.contributor.authorVermaerke, Frank
dc.contributor.authorVermeire, Gerrit
dc.contributor.authorVan Daele, P.
dc.contributor.authorDemeester, Piet
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-09-29T13:05:26Z
dc.date.available2021-09-29T13:05:26Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/609
dc.sourceIIOimport
dc.titleImproved on-chip lightwave measurements of non-planar optoelectronic devices
dc.typeProceedings paper
dc.contributor.imecauthorDemeester, Piet
dc.contributor.imecauthorMartens, Luc
dc.source.peerreviewno
dc.source.beginpage812
dc.source.endpage815
dc.source.conferenceIntegrating Intelligent Instrumentation and Control.1995 IEEE Instrumentation/Measurement Technology Conference. IMTC Proceeding
dc.source.conferencelocation
imec.availabilityPublished - imec


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