dc.contributor.author | Chen, Jian | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2021-10-14T21:13:51Z | |
dc.date.available | 2021-10-14T21:13:51Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6101 | |
dc.source | IIOimport | |
dc.title | Raman spectroscopy as a stress sensor in packaging: correct formulae for different sample surfaces | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1310 | |
dc.source.endpage | 1317 | |
dc.source.conference | Proceedings 52nd Electronic Components and Technology Conference | |
dc.source.conferencedate | 28/05/2002 | |
dc.source.conferencelocation | San Diego, CA USA | |
imec.availability | Published - imec | |