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Impact of advanced processing modules on the low-frequency noise performance of deep submicron CMOS technologies

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-14T21:15:05Z
dc.date.available2021-10-14T21:15:05Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6118
dc.sourceIIOimport
dc.titleImpact of advanced processing modules on the low-frequency noise performance of deep submicron CMOS technologies
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceIEEE Workshop on Future Challenges in the Deep Sub-Micron Era
dc.source.conferencedate26/03/2002
dc.source.conferencelocationBangalore India
imec.availabilityPublished - imec


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